2018 ERC Starting Grant Award Winner and

2018 MSA Albert Crewe Major Award Winner

Group Leader,

Higher Dimensional Electron Microscopy Group

Max Planck Institute for Solid State Research, Stuttgart, Germany

Abstract:

Aberration-Corrected TEM/STEM have advanced to the point that achieving atomic resolution optically is routine. However many materials are sensitive to the electron beam, placing a limit on how well they can be resolved with conventional imaging. Furthermore, imaging directly in 3D remains far more challenging than in projection. In this talk, electron ptychography will be introduced as a means of providing high dose efficiency imaging in the STEM, thus combining the benefits of efficient phase contrast imaging and the simultaneous compositional sensitivities of STEM in the same microscope. Optical sectioning will also be introduced, with greater 3D resolution expected from advances in aberration corrector design.  The exciting prospects for low dose and cryo ptychography and optical sectioning will be explored.

报告邀请人：杜世萱 研究员

报告联系人：鲍丽宏，电话：9662