Seeing Clearer: Advancing STEM Through Multidimensional Approaches from Ptychography to Optical Sectioning
2018 ERC Starting Grant Award Winner and
2018 MSA Albert Crewe Major Award Winner
Higher Dimensional Electron Microscopy Group
Max Planck Institute for Solid State Research, Stuttgart, Germany
Aberration-Corrected TEM/STEM have advanced to the point that achieving atomic resolution optically is routine. However many materials are sensitive to the electron beam, placing a limit on how well they can be resolved with conventional imaging. Furthermore, imaging directly in 3D remains far more challenging than in projection. In this talk, electron ptychography will be introduced as a means of providing high dose efficiency imaging in the STEM, thus combining the benefits of efficient phase contrast imaging and the simultaneous compositional sensitivities of STEM in the same microscope. Optical sectioning will also be introduced, with greater 3D resolution expected from advances in aberration corrector design. The exciting prospects for low dose and cryo ptychography and optical sectioning will be explored.